Agilent U9830A 納米壓痕儀G300
名稱：涂鍍層測厚儀
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簡介：Agilent U9830A 納米壓痕儀G300支持測量范圍達(dá)300毫米。為工業(yè)用戶提供一種優(yōu)秀的長期投資，它提供了一個(gè)快速可靠的方法獲取數(shù)據(jù)，該G300允許多層次的測試，促進(jìn)產(chǎn)品開發(fā)和故障分析，可以產(chǎn)生重大影響產(chǎn)量，性能和壽命的設(shè)備。電磁...
- 產(chǎn)品介紹
Agilent U9830A 納米壓痕儀G300支持測量范圍達(dá)300毫米。為工業(yè)用戶提供一種優(yōu)秀的長期投資，它提供了一個(gè)快速可靠的方法獲取數(shù)據(jù)，該G300允許多層次的測試，促進(jìn)產(chǎn)品開發(fā)和故障分析，可以產(chǎn)生重大影響產(chǎn)量，性能和壽命的設(shè)備。電磁驅(qū)動(dòng)允許無與倫比的動(dòng)態(tài)范圍的力和位移。它可以測量變形超過六個(gè)數(shù)量級從納米到毫米。
Agilent U9830A 納米壓痕儀G300主要特性與技術(shù)指標(biāo)
•Results compliant with ISO 14577 結(jié)果符合國際標(biāo)準(zhǔn)ISO 14577
•Sample stage for specimens with dia. up to 300 mm •樣品測量范圍可達(dá)300毫米
•Full testing automation lets instrument run unattended •全自動(dòng)化測試讓儀器自動(dòng)運(yùn)行
•Flexibility, upgradability for repeatable or new applications •靈活，可重復(fù)為新的應(yīng)用升級
•Dynamic properties characterization via CSM by indent depth
•Real-time control, easy protocol development, drift compensation•實(shí)時(shí)控制，容易協(xié)議開發(fā)，漂移補(bǔ)償
•NanoIndenter e-Seminar recordings•納米級電子測量
描述
The Nano Indenter G300 utilizes a stage that supports samples with diameters up to 300 mm. An excellent long-term investment for industrial users, it provides a fast, reliable method for acquiring mechanical data on uncut silicon wafers. The G300 permits testing of multiple layers, facilitating product development and failure analysis which can have a significant effect on yield, performance and longevity to devices.
Electromagnetic actuation allows unparalleled dynamic range in force and displacement. It enables measurement of deformation over six orders of magnitude from nanometers to millimeters.
